首页> 外国专利> Position detection apparatus that detects a position of an object by detecting light from a scale, and lithography apparatus, force sensor, and apparatus having force sensor including the position detection apparatus

Position detection apparatus that detects a position of an object by detecting light from a scale, and lithography apparatus, force sensor, and apparatus having force sensor including the position detection apparatus

机译:通过检测来自刻度的光,光刻装置,力传感器和具有包括位置检测装置的力传感器的光刻装置,力传感器和装置检测物体的位置检测装置

摘要

The present invention provides a position detection apparatus that is provided with a scale and a detector and includes a processing unit configured to perform processing for setting a number of light receiving elements that are consecutive in a direction of relative movement and whose outputs are to be added for the light receiving elements so that, in a first resolution mode, a phase of a component of a fourth spatial frequency lower than a spatial frequency corresponding to a frequency offset amount is detected and, in a second resolution mode for which a resolution is lower than the first resolution mode, a phase of a component of a spatial frequency of an interference image of a second grating pattern is detected.
机译:本发明提供了一种位置检测装置,其提供具有刻度和检测器,并且包括处理单元,该处理单元被配置为执行用于设置在相对运动方向上连续的光接收元件的处理的处理,并且要添加其输出 对于光接收元件使得在第一分辨率模式中,检测到与对应于频率偏移量的空间频率的第四空间频率的分量的相位,并且在第二分辨率模式下 比第一分辨率模式,检测到第二光栅图案的干扰图像的空间频率的分量的分量的相位。

著录项

  • 公开/公告号US11085799B2

    专利类型

  • 公开/公告日2021-08-10

    原文格式PDF

  • 申请/专利权人 CANON KABUSHIKI KAISHA;

    申请/专利号US201916565590

  • 发明设计人 CHIHIRO NAGURA;

    申请日2019-09-10

  • 分类号G01D5/347;

  • 国家 US

  • 入库时间 2024-06-14 21:55:33

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