A system and method for converting large data into smaller representations and reconverting smaller representations into initial large data

摘要

The system comprises at least one processor with one or more cores and a memory containing instructions for configuring the processor to perform the method, the method being a step of receiving a dataset of a certain data length. The step of determining the bit pattern of the data set and the step of generating the reference set of the bit pattern, the reference set having a set length, the set length equal to the data length, and the reference set of the bit pattern. Determines the first test bit pattern using the first bit pattern generation function applied to the test data, with a step containing all possible different bit patterns from all 0s to all 1s. The location of the first test bit pattern and the location of the data set bit pattern are used to determine the distance between the first test bit pattern and the data set bit pattern, and these locations are , Repeat the first test pattern generation function in the direction of the bit pattern of the data set with steps equal to the reference set of bit patterns, and combine the first test pattern generation function with at least one second test pattern generation function. The second test bit pattern and dataset are used to determine the second test bit pattern that applies to the test data, and the location of the second test bit pattern and the location of the data set bit pattern. Steps to determine the distance between the bit patterns of the data, and these locations are the steps equal to the reference set of the bit patterns and the distance between the second test bit pattern and the bit patterns of the data set. If it is less than or equal to the threshold distance, it is a step of generating an error function based on the threshold distance, providing a bit pattern function and an error function, and reproducing the data set, wherein the bit pattern function is the first test. It includes an iteration of the pattern generation function, a step equal to a combination of the first test pattern generation function and at least one second test pattern generation function, and a step of recovering the data set based on the bit pattern function and the error function. [Selection diagram] Fig. 1