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How to align multi beam irradiation systems

机译:如何对准多光束辐射系统

摘要

A method of aligning a multi beam irradiation system 20 for use in a device 10 for manufacturing a three-dimensional workpiece by irradiating a layer of raw material powder by electromagnetic or particle radiation, the methodI) radiation beam 24a emitted by irradiation systemThe first raw material powder layer is coated on the carrier 16 to define the irradiation plane s irradiated byII) the first test structure 34 is manufactured in the overlapped zone 18C of the irradiation plane s using the first radiation beam 24a emitted by the calibrated first irradiation unit 22a of the irradiation system 20, andIII) using the second radiation beam 24B emitted by the calibrated second irradiation unit 22b of the irradiation system 20, the second test structure 36 is manufactured in the overlap zone 18C of the irradiation plane s, andIV) first and second test structures 34 in the irradiation plane sOffset DXT between 36Measuring DYT andV) the first and second test structures 34, so that the offset does not exceed the thresholdMeasurement offset DXT between 36First and second configured irradiation unit 22a based on DYTAligning at least one of 22b and.
机译:一种对准多光束照射系统20,用于通过电磁或粒子辐射照射一层原料粉末,通过照射系统发射的第一个原料发出的方法,通过电磁或粒子辐射来制造三维工件的装置10.粉末层涂覆在载体16上以限定照射平面S辐照,第一测试结构34使用由校准的第一照射单元22a发射的第一辐射束24a在照射平面S的重叠区18c中制造照射系统20,ANDII)使用由照射系统20的校准的第二照射单元22b发射的第二辐射束24b,第二测试结构36在照射平面S,ANDIV的重叠区18c中制造第一和第二测试结构34在照射平面Soffset DXT之间36芯达到频道之间的第一个和第二测试结构34,使耳机T基于Dytaligning的22B和22B中的至少一个,T在36First和第二配置的照射单元22a之间不超过阈值和第二配置的照射单元22a之间。

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