首页>
外国专利>
Scan cell architecture for improving test coverage and reducing test application time
Scan cell architecture for improving test coverage and reducing test application time
展开▼
机译:扫描单元架构,用于提高测试覆盖率和减少测试时间
展开▼
页面导航
摘要
著录项
相似文献
摘要
A scan cell comprises: a state element and selection and combination circuitry. The selection and combination circuitry comprises first combination circuitry configured to combine a signal from a scan input of the scan cell with a signal from a functional circuit input of the scan cell to generate a first signal, second combination circuitry configured to combine the signal from the functional circuit input of the scan cell with an output signal of the state element to generate a second signal, and selection circuitry configured to select an input signal for the state element from the signal from the scan input of the scan cell, the signal from the functional circuit input of the scan cell, the first signal, and the second signal based on two selection input signals of the scan cell.
展开▼