首页> 外国专利> Electric interferences suppression device - removes interferences caused by electromagnetic fields affecting pulse operated defectoscope

Electric interferences suppression device - removes interferences caused by electromagnetic fields affecting pulse operated defectoscope

机译:电干扰抑制装置-消除电磁场对脉冲操作缺陷镜造成的干扰

摘要

The device is a controllable electronic switch connected in parallel with the control element input; and the resistance of the closed switch is much lower than that of the control element input. The switch control circuit is tuned to the defectoscope measurement range and is connected to its supply mains, so that when an interference appears within the above measurement range, the circuit generates a signal which trips the switch into its closed state, so that the control element input is short-circuited; the switch is a transistor whose collector is connected to the control element input, and its base through the above control circuit to the defectoscope supply mains; or the switch is an electronic valve whose anode and grid are connected as the above collector and base.
机译:该设备是与控制元件输入并联的可控电子开关。闭合开关的电阻远低于控制元件输入的电阻。开关控制电路被调谐到缺陷检查仪的测量范围并连接到其电源,这样当在上述测量范围内出现干扰时,该电路会产生一个信号,使开关跳闸到其闭合状态,从而使控制元件输入短路;开关是一个晶体管,其集电极连接到控制元件的输入端,其基极通过上述控制电路连接到缺陷检查仪的电源。或者开关是一个电子阀,其阳极和栅极作为上述集电极和基极连接。

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