EDDY CURRENT DEVICE FOR MEASURING DIELECTRIC COATING THICKNESS AND ELECTRIC CONDUCTIVITY OF NON-FERROMAGNETIC SUBSTRATE

• 1. 测量铁磁导电基体上的非铁磁导电层厚度的方法和装置 [P] . 中国专利： CN1138126C . 2004.02.11
• 2. 测量铁磁导电基体上的非铁磁导电层厚度的方法和装置 [P] . 中国专利： CN1180406A . 1998-04-29
• 3. EDDY-CURRENT THICKNESS GAUGE FOR DIELECTRIC COATINGS ON CONDUCTING NON-FERROMAGNETIC BASE [P] . SU1263994A1 . 1986-10-15

  机译： 导电非铁磁性基体上电介质涂层的涡流厚度规

• 4. EDDY-CURRENT THICKNESS GAUGE FOR MEASURING DIELECTRIC COATINGS IN ELECTRICALLY-CONDUCTING BASE [P] . SU1384930A1 . 1988-03-30

  机译： 涡流测厚仪在导电基底中测量电介质涂层

• 5. EDDY-CURRENT APPARATUS FOR MEASURING ELECTRIC CONDUCTIVITY OF NON-FERROMAGNETIC ARTICLES [P] . SU1224705A1 . 1986-04-15

  机译： 用于测量非铁磁制品导电性的涡流仪

• 1. A comparative study of eddy-current phase and eddy-current frequency methods of thickness measurement of electrically conductive non-ferromagnetic coatings on electrically conductive nonferromagnetic substrates [C] . Vladimir A. Syasko, Anton E. Ivkin, Irina V. Pilatova NDT 2010 conference . 2010
• 2. The application of dielectric analysis and thermally stimulated current analysis to polymer coating solutions, films and coated substrates. [D] . Fiorelli, Kenneth James. 1994
• 3. Dielectric Properties of Glass Beads with Talc as a Reference Material for Calibration and Verification of Dielectric Methods and Devices for Measuring Soil Moisture [O] . Justyna Szerement, Hironobu Saito, Kahori Furuhata, 2020
• 4. Study on the interactions between the coatings of electric conductor or dielectric media and piezoelectric substrate in the piezoelectric functional devices [O] . Peng-Fei Hou, Yang Zhang, Bing-Jie Chen 2017
• 5. Device for monitoring the thickness of a dielectric coating on a dielectric substrate. (Ustroystvo dlya kontrolya tolshchiny dielektricheskogo pokrytiya na dielektricheskoy osnove). [R] . Skripnik, Y. A., Dykov, A. N., Sviridov, N. M. 1992

• 1. Epitaxial Lead Selenide Layers over a Wide Range of Their Thickness on Dielectric Substrates [J] . Arif M. Pashaev ,Omar I. Davarashvili ,Megi I. Enukashvili . 材料科学与工程：中英文B版 . 2013,第002期
• 2. Thickness Dependence of Dielectric Characteristics of SrTiOsub3/subThin Films on MgAlsub2/subOsub4/subSubstrates [J] . Ryuhei Kinjo ,Iwao Kawayama ,Hironaru Murakami . 材料物理与化学进展（英文） . 2013,第1期
• 3. Transparency of a Dielectric with Current Conductive Coating to Microwave Radiation [J] . Vladimir G. Sidorovich . 现代物理（英文） . 2011,第11期
• 4. Electrical Conductivity, Magnetoconductivity and Dielectric Behaviour of (Mg,Ni)-Ferrite below Room Temperature [J] . Somenath Ghatak ,Ajit Kumar Meikap ,Manika Sinha . 材料科学与应用期刊（英文） . 2010,第4期
• 5. New Method of Thermal Energy—To Electrical Energy Conversion in Vacuum Devices with the Metal—Dielectric Nanofilm Electron Sources [J] . V. E. Ptitsin . 材料科学与应用期刊（英文） . 2018,第13期
• 6. 影响铝合金电导率测量结果的因素及涡流电导率测量系统分析 [C] . 范兴义 ,罗顺明 ,李雪 . 西南地区第十二届无损检测学术年会 . 2013
• 7. 基于有限元的管状基体涂层厚度涡流法测量仿真研究 [A] . 杨晓辉 . 2015