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Ion beam analyzer and method for determining the field desorption - characteristic groe sen in the case of an ion beam analyzer

机译:在离子束分析仪的情况下,离子束分析仪和用于确定场解吸特性的方法

摘要

The ion beam from a field desorption source in a double focusing magnetic mass spectrometer is monitored by disabling the electric sector of the mass analyzer such that the ion beam is not deflected. An opening is provided in the wall of the electric sector such that the undeflected ion beam may pass therethrough to a detector. This permits the characteristics of the field desorption source to be ascertained more quickly and easily so that a mass analysis may be performed. The monitor may be operated automatically to vary a characteristic of the field desorption source until ions are detected. Thereafter, the electric sector is energized and an analysis performed.
机译:通过禁用质量分析器的电扇,以使离子束不发生偏转,可以监控来自双聚焦磁性质谱仪中场解吸源的离子束。在电扇的壁中设置有开口,使得未偏转的离子束可以穿过其中到达检测器。这允许更快速和容易地确定场解吸源的特性,从而可以进行质量分析。监测器可以自动操作以改变场解吸源的特性,直到检测到离子为止。之后,给电扇通电并进行分析。

著录项

  • 公开/公告号DE2754198A1

    专利类型

  • 公开/公告日1978-06-08

    原文格式PDF

  • 申请/专利权人 DU PONT;

    申请/专利号DE19772754198

  • 发明设计人 MCKINNEY CHARLES RAYMOND;

    申请日1977-12-06

  • 分类号G01N27/62;H01J39/34;

  • 国家 DE

  • 入库时间 2022-08-22 21:54:45

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