Test bit train generating circuit - applies bit trains to shift registers and applies them through delay circuits and amplifier to tested circuit

摘要

The bit train is intended for testing of logic circuits. At least two bit trains can be fed in shift registers (2, 3). They are in cyclical operation switched over, and clock pulses of different frequencies can be applied to them. A delay circuit (4, 5) is connected to the output of each shift register (2, 3). Output signals of the shift registers (2, 3) are synchronously applied to the dealy circuits (4, 5) connected to the tested circuit (1) through amplifiers (12-18).