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HIGH FREQUENCY ION IMPLANTED PASSIVATED SEMI-CONDUCTOR DEVICES AND MICROWAVE INTEGRATED CIRCUITS AND PLANAR PROCESSES FOR FABRICATING THE SAME
HIGH FREQUENCY ION IMPLANTED PASSIVATED SEMI-CONDUCTOR DEVICES AND MICROWAVE INTEGRATED CIRCUITS AND PLANAR PROCESSES FOR FABRICATING THE SAME
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机译:高频离子注入钝化半导体器件和微波集成电路以及用于制造相同器件的平面工艺
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摘要
1532579 Semiconductor devices HUGHES AIRCRAFT CO 4 May 1977 [21 May 1976] 18669/77 Heading H1K A micro-wave generating semiconductor device is manufactured in a high-resistivity semiconductor substrate 14 by forming an insulating ion implantation mask 18 and implanting therethrough firstly a buried region 22 (P-type in an N-type substrate) then further regions above the region 22 (e.g. a flat profile P-type zone 32 and an NSP+/SP region 42), removing substrate material from the rear surface to form a recess 54 exposing the buried region, and providing ohmic contacts 56, 62 and preferably also heat sinks 58, 64 to the exposed regions 42 and 22. The device may be disvate or may be integrated with a similarly manufactured PIN modulator diode (Fig. 12, not shown). Other integrated arrangements are also mentioned.
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机译:1532579半导体器件HUGHES AIRCRAFT CO 1977年5月4日[1976年5月21日] 18669/77标题H1K通过形成绝缘离子注入掩模18并首先通过掩埋注入,在高电阻率半导体衬底14中制造了微波产生半导体器件。区域22(N型衬底中的P型),然后在区域22上方的其他区域(例如,平面P型区域32和N + SP>区域42),从背面形成凹部54,该凹部54暴露出掩埋的区域,并向暴露的区域42和22提供欧姆接触56、62,最好还提供散热片58、64。该器件可以是位移的,或者可以与类似制造的PIN调制器集成在一起二极管(图12,未显示)。还提到了其他综合安排。
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