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MANUFACTURE OF AL GATE CMOS IC

机译:AL GATE CMOS IC的制造

摘要

PURPOSE:To equalize threshold voltage and thus to minimize substrate bias effect and junction capacity by doping a P-type impurity on both channel portions of P-channel MOSFET and N-channel MOSFET and changing flat-band voltage (VFB) in the positive direction. CONSTITUTION:An oxidized film 2 is formed on an N-type Si substrate, an opening is arranged by means of a photoresist film pattern 3 and boron ion is dirven therein with the film 3 working as a mask, a low density P-type diffusion is carried out in an oxidized atmosphere to obtain a high density P-type diffusion layer 5, and a phosphorus diffusion is carried out successively in the oxidized atmosphere to obtain a high density V-type diffusion layer 6. Then, an SiO2 gate oxidized film is formed by carrying out photoetching on a portion 8 through which to arrange a contact hole on a channel area 7 of an N-channel MOSFET and also on both layers 5, 6, the boron ion is driven concurrently in both MOSFET's to change VFB of the area 7 in the positive direction, thereby forming an Al electrode 9.
机译:目的:通过在P沟道MOSFET和N沟道MOSFET的两个沟道部分上掺杂P型杂质并沿正方向改变平带电压(VFB),以均衡阈值电压,从而最小化衬底偏置效应和结电容。组成:在N型硅衬底上形成氧化膜2,通过光致抗蚀剂膜图形3布置开口,并以膜3作为掩模在其中引入硼离子,低密度P型扩散在氧化气氛中进行氧化以获得高密度的P型扩散层5,然后在氧化气氛中进行磷的扩散,从而获得高密度的V型扩散层6。然后,形成SiO 2栅氧化膜通过在部分8上进行光蚀刻而形成光刻胶,通过该部分在N沟道MOSFET的沟道区域7上以及还在两个层5、6上布置接触孔,在两个MOSFET中同时驱动硼离子以改变VFB的VFB。在正方向上形成区域7,从而形成Al电极9。

著录项

  • 公开/公告号JPS5543842A

    专利类型

  • 公开/公告日1980-03-27

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP19780116524

  • 发明设计人 MEGURO RIYOU;

    申请日1978-09-25

  • 分类号H01L29/06;H01L21/265;H01L21/8238;H01L27/092;H01L29/78;

  • 国家 JP

  • 入库时间 2022-08-22 18:52:10

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