首页> 外国专利> metanordning for examination of the characteristics of a pammultipelfelt approaches elements in an electronic teleforbindelsevexel

metanordning for examination of the characteristics of a pammultipelfelt approaches elements in an electronic teleforbindelsevexel

机译:用于检查pammultipelfelt特性的metanordning接近电子远射电子

摘要

To measure electrical characteristics of a line segment, a switch or some other circuit element of a time-sharing telecommunication network using pulse-amplitude modulation, a transmission path is established between two subscriber lines through the circuit element to be tested, these subscriber lines being respectively connected to a generator of a sinusoidal test signal and to a highly sensitive signal detector. The two subscriber lines are briefly closed during a single sampling interval, or during two consecutive sampling intervals separated by an intervening guard interval during which capacitively stored residual energy is dissipated, depending on the nature of the test.
机译:为了使用脉冲幅度调制来测量分时通信网络的线段,开关或某些其他电路元件的电气特性,在两条用户线之间通过要测试的电路元件建立传输路径,这些用户线是分别连接到正弦测试信号的发生器和高灵敏度信号检测器。两条用户线在单个采样间隔内,或者在两个连续的采样间隔之间短暂地闭合,该间隔由中间的保护间隔隔开,在此间隔内,根据测试的性质,会消耗掉电容性存储的剩余能量。

著录项

  • 公开/公告号SE8100698L

    专利类型

  • 公开/公告日1981-08-19

    原文格式PDF

  • 申请/专利权人 ITALTEL SPA;

    申请/专利号SE19810000698

  • 发明设计人 SBUELZ A;

    申请日1981-01-30

  • 分类号H04M3/22;

  • 国家 SE

  • 入库时间 2022-08-22 16:00:02

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