首页> 外国专利> Image plane positioner for semiconductor substrate photolithography - utilises two light beams in same plane, perpendicular to and intersecting at image plane centre

Image plane positioner for semiconductor substrate photolithography - utilises two light beams in same plane, perpendicular to and intersecting at image plane centre

机译:用于半导体基板光刻的像面定位器-在同一平面中利用两个光束,垂直于像平面中心并在像平面中心处相交

摘要

The device accurately positions the surface of a substrate (11) in the image plane (5) of a projecting objective lens (6) having a short focal distance, and can be used e.g., for the photolithographic transfer of structures onto semiconductor components. The device contains an illuminating system (1,2) which generates two light beams (3,4) and a photosensitive receiving system (9,10) for the light beams (7,8). Both these systems are external to the projecting objective lens (6). The two light beams (3,4) are placed in a plane which is pref. perpendicular to the image plane (5). The intersection between the two light beams (3,4) is situated in the centre of the image plane (15). A vertical shifting or a tilting of the substrate's (11) surface in relation to the image plane is detected with certainty.
机译:该装置将基板(11)的表面精确地定位在具有短焦距的投射物镜(6)的像平面(5)中,并且可以例如用于结构的光刻转移到半导体部件上。该装置包括产生两个光束(3,4)的照明系统(1,2)和用于光束(7,8)的光敏接收系统(9,10)。这两个系统都在投射物镜(6)的外部。两个光束(3,4)放置在首选平面中。垂直于像平面(5)。两个光束(3,4)之间的交点位于像平面(15)的中心。可以确定地检测到基板(11)表面相对于图像平面的垂直移动或倾斜。

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