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Pressure sensing elements (壓力 感知 素 子) with a semiconductor device and its manufacturing method

机译:Pressure sensing elements (压力 感知 素 子) with a semiconductor device and its manufacturing method

摘要

PURPOSE:To obtain a flat back surface and to make it possible to provide other active elements on a substrate at the peripheral part of a pressure sensing element, by providing a layer, into which high concentration impurities are introduced, on the bottom surface of a thin film part, which is contacted with a concave part that forms the pressure sensing element, thereby controlling the etching speed when the concave part is etched. CONSTITUTION:A photoresist mark 14 is provided at the back surface of a low impurity concentration p type Si substrate 6. Anisotropic etching, which uses alkali etching liquid such as KOH, is performed, and a deep concave part 15 is provided so as to reach an n+ type embedded layer 9. When alkali etching of an impurity doped silicon crystal substrate is performed, the etching speed is quickly lowered when impurity concentration approaches the order of 1019. Therefore, when the etching reaches a high concentration embedded layer, the etching speed is controlled by itself. Therefor partial unevenness of etching caused by foreign matters, dirt, crystal defects, and the like on the back surface of the substrate is eliminated, and the flat etched surface is obtained as the bottom surface of the thin film part.
机译:用途:为了获得平坦的背面,并通过在压力传感器元件的底面上设置一层引入高浓度杂质的层,可以在压力传感元件外围部分的基板上提供其他有源元件。薄膜部分与形成压力感测元件的凹入部分接触,从而在蚀刻凹入部分时控制蚀刻速度。组成:在低杂质浓度的p型Si衬底6的背面提供了光刻胶标记14。执行各向异性蚀刻,该蚀刻使用诸如KOH的碱性蚀刻液进行,并提供深凹部15以达到n +型嵌入层9。当执行掺杂杂质的硅晶体衬底的碱蚀刻时,当杂质浓度接近10 19的数量级时,蚀刻速度迅速降低。因此,当蚀刻到达高浓度嵌入层时,蚀刻速度由其自身控制。因此,消除了由在基板的背面上的异物,污垢,晶体缺陷等引起的蚀刻的局部不均匀,并且获得了平坦的蚀刻表面作为薄膜部分的底表面。

著录项

  • 公开/公告号KR840007315A

    专利类型

  • 公开/公告日1984-12-06

    原文格式PDF

  • 申请/专利权人 미쓰다 가쓰시게;

    申请/专利号KR19830006103

  • 发明设计人 시미즈 이사오(외 1);

    申请日1983-12-22

  • 分类号H01L29/84;

  • 国家 KR

  • 入库时间 2022-08-22 08:01:12

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