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Semiconductor device having a substrate covered with a high impurity concentration first polycrystalline layer and then a lower impurity concentration second polycrystalline layer

机译:半导体器件具有被高杂质浓度的第一多晶层然后被低杂质浓度的第二多晶层覆盖的衬底

摘要

A semiconductor device has a semiconductor substrate of a first conductivity type, and a diffused region of a second conductivity type. A first insulation film is formed on the substrate, having an opening exposing the surface of the diffused region. First and second polycrystalline layers doped with impurities associated with the second conductivity type are disposed in the opening, and the concentration of the impurities of the first polycrystalline layer is higher than that of the second polycrystalline layer. A metal electrode is formed on the second polycrystalline layer.
机译:半导体器件具有第一导电类型的半导体衬底和第二导电类型的扩散区域。第一绝缘膜形成在基板上,具有开口,该开口暴露出扩散区域的表面。掺杂有与第二导电类型相关的杂质的第一和第二多晶层设置在开口中,并且第一多晶层的杂质浓度高于第二多晶层的杂质浓度。在第二多晶层上形成金属电极。

著录项

  • 公开/公告号US4516147A

    专利类型

  • 公开/公告日1985-05-07

    原文格式PDF

  • 申请/专利权人 TOKYO SHIBAURA DENKI KABUSHIKI KAISHA;

    申请/专利号US19840582857

  • 发明设计人 HIROSHI INOUE;SHIGERU KOMATSU;

    申请日1984-02-24

  • 分类号H01L29/04;H01L23/48;H01L29/34;

  • 国家 US

  • 入库时间 2022-08-22 07:52:39

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