首页> 外国专利> METHOD OF FORMING INTEGRATED CIRCUIT HAVING P-N-P AND N-P-N TRANSISTORS HAVING CURRENT FLOWS ISOLATED FROM EACH OTHER AND PERPENDICULAR TO EACH OTHER ON SUBSTRATE MADE OF N-TYPE SEMICONDUCTOR MATERIAL

METHOD OF FORMING INTEGRATED CIRCUIT HAVING P-N-P AND N-P-N TRANSISTORS HAVING CURRENT FLOWS ISOLATED FROM EACH OTHER AND PERPENDICULAR TO EACH OTHER ON SUBSTRATE MADE OF N-TYPE SEMICONDUCTOR MATERIAL

机译:形成具有P-N-P和N-P-N晶体管的集成电路的方法,该晶体管具有由N型半导体材料制成的,彼此隔离且垂直于彼此的电流

摘要

PURPOSE: To ensure excellent dynamic characteristics without limiting the maximum working voltage by decreasing the collector series resistance of PNP and NPN transistors and attaining a substantially constant low concentration collector thickness. CONSTITUTION: Two P+ type regions 2, 3 for forming a horizontal isolation region of an NPN transistor and a low resistivity collector region of a PNP transistor are formed conventionally on an N type single crystal silicon substrate 1. An N+ region 4 serving as a low resistivity collector region of an NPN transistor is then formed in the region 2 followed by growth of an N type epitaxial layer 5. Subsequently, P+ type regions 6, 7, 8 and 9 are diffused until these regions touch the regions 2, 3. The regions 2, 6 and 7 are combined together and then the base and emitter regions of the NPN transistor surround an N type region 10 being diffused therein completely and the regions 3, 8 and 9 serve together as the collector region of the PNP transistor. A P type region 12 is diffused in an N type region 11 and serve the lightly doped collector region of the PNP transistor.
机译:目的:通过减小PNP和NPN晶体管的集电极串联电阻并获得基本恒定的低浓度集电极厚度,来确保出色的动态特性而又不限制最大工作电压。构成:通常在N型单晶硅衬底1上形成两个用于形成NPN晶体管的水平隔离区和PNP晶体管的低电阻集电极区的P +型区域2、3。然后在区域2中形成用作NPN晶体管的低电阻率集电极区域的区域4,然后生长N型外延层5。随后,扩散P +型区域6、7、8和9,直到这些区域接触区域2、3。区域2、6和7合并在一起,然后NPN晶体管的基极和发射极区域围绕一个N型区域10,该区域完全扩散在其中,区域3、8和9共同用作PNP晶体管的集电极区域。 P型区域12在N型区域11中扩散并且用作PNP晶体管的轻掺杂集电极区域。

著录项

  • 公开/公告号JPH0212926A

    专利类型

  • 公开/公告日1990-01-17

    原文格式PDF

  • 申请/专利权人 SGS THOMSON MICROELETTRONICA SPA;

    申请/专利号JP19890106088

  • 发明设计人 RAFUAERE ZANBURAANO;SARUBATOORE MUSUMECHI;

    申请日1989-04-27

  • 分类号H01L29/73;H01L21/331;H01L21/761;H01L21/8228;H01L27/082;H01L29/732;

  • 国家 JP

  • 入库时间 2022-08-22 06:27:08

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