首页> 外国专利> Error log system for self-testing in very large scale integrated circuit (VLSI) units

Error log system for self-testing in very large scale integrated circuit (VLSI) units

机译:用于大型集成电路(VLSI)单元自检的错误记录系统

摘要

A VSLI chip is implemented with registers which log permanent and intermittent errors occurring within the chip as sensed by concurrent error detection circuitry (CED). If a fatal error is detected (one which would destroy the reliability of chip operations), then the chip is immobilized into a hold mode (freeze). Interrupts are signalled to a cooperating maintenance controller which can pass the error information to an external computer for display and for locating a faulty area.
机译:VSLI芯片通过寄存器实现,该寄存器记录并发错误检测电路(CED)所检测到的芯片中发生的永久性和间歇性错误。如果检测到致命错误(这将破坏芯片操作的可靠性),则将芯片固定为保持模式(冻结)。中断被通知给协作维护控制器,该维护控制器可以将错误信息传递到外部计算机以进行显示和定位故障区域。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号