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WEIGHTLESS TRIAL EXAMINATION METHOD OF DEVELOPMENT TEST DEVICE

机译:开发测试装置的无权审定方法

摘要

PURPOSE:To set a sample to be examined easily and to eliminate the influence in the horizontal direction on the sample owing to the tension variation of a hanging wire by providing a spring of a constant tension on the way of the wire to hanging the sample. CONSTITUTION:By cutting off the fixing member with an artificial satellite 1, a sample 2 to be examined makes a developing movement in the direction of the arrow 7. In this case, a tensile force P 12 which can hang a mass same as that of the sample 2 is imposed to a wire to hang the sample 2. When the rotation axis of the development mechanisms 3a and 3b of the sample 2 and the rotation axis of the rotary part 10 of a test device are slipped from each other by a minute angle, the distance between the sample 2 and an arm 9 is extended or reduced gradually from the development mechanism 3 to the tip of the sample 2 following the development of the sample 2. In this case, since a spring 15 is extended or contracted in response to the variation of the length while maintaining the variation of the tension P12 at the minimum value, the variation in the rotational friction force in the development mechanism 3 generated following the developing movement can be maintained at a minute value.
机译:目的:通过在线材悬挂样品的过程中提供恒定张力的弹簧,使样品易于检查,并消除由于悬挂线材张力变化而在水平方向上对样品的影响。组成:通过用人造卫星1切下固定件,待检查的样品2沿箭头7的方向进行显影运动。在这种情况下,可悬挂质量为P 12的拉力P 12样品2被施加到电线上以悬挂样品2。当样品2的显影机构3a和3b的旋转轴与测试装置的旋转部分10的旋转轴彼此滑动一分钟时。在一定角度下,样品2与臂9之间的距离随着样品2的显影而从显影机构3到样品2的尖端逐渐增加或减小。在这种情况下,由于弹簧15在样品2中伸展或收缩。响应于长度的变化,同时将张力P12的变化保持在最小值,随着显影运动而在显影机构3中产生的旋转摩擦力的变化可以保持在微小的值。

著录项

  • 公开/公告号JPH03137000A

    专利类型

  • 公开/公告日1991-06-11

    原文格式PDF

  • 申请/专利权人 MITSUBISHI ELECTRIC CORP;

    申请/专利号JP19890276410

  • 发明设计人 AKAO HIROSHI;

    申请日1989-10-24

  • 分类号B64G7/00;

  • 国家 JP

  • 入库时间 2022-08-22 06:06:42

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