首页> 外国专利> OPTICAL INSPECTION SYSTEM HAVING OPTICAL TELECENTRIC SCANNING SYSTEM COMBINED WITH TELECENTRIC CONDENSER LENS

OPTICAL INSPECTION SYSTEM HAVING OPTICAL TELECENTRIC SCANNING SYSTEM COMBINED WITH TELECENTRIC CONDENSER LENS

机译:结合有光学电容式镜头的光学检查系统的光学检查系统

摘要

PURPOSE: To provide an optical system used for detecting a flaw, blister, dust, foreign matter, etc., of a liquid crystal display glass plate, a semiconductor wafer, a reticule or a mask glass blanks at high speed and at high S/N ratio. ;CONSTITUTION: A laser is used as a light source, a telecentric scanning optical system is disposed, and an object to be, inspected is placed in the focal position of the optical system. A telecentric condenser lens 4 is disposed in such a manner that the focal plane is directed to the focal plane of a first telecentric scanning optical system and aligned therewith. In the rear side outgoing pupil of the condenser lens 4, zero-order diffracted light is missed by filtering, and only the scattered light is taken in. The telecentric scanning optical system and the telecentric condenser lens are combined together.;COPYRIGHT: (C)1995,JPO
机译:目的:提供一种光学系统,用于以高速和高S / s检测液晶显示玻璃板,半导体晶片,标线或掩模玻璃毛坯的缺陷,起泡,灰尘,异物等。 N比。 ;构成:使用激光作为光源,设置远心扫描光学系统,将要检查的物体放置在光学系统的焦点位置。远心聚光透镜4被布置为使得焦平面指向第一远心扫描光学系统的焦平面并与其对准。在聚光透镜4的后侧出射光瞳中,滤除了零级衍射光,仅吸收了散射光。远心扫描光学系统和远心聚光透镜组合在一起。 1995年,日本特许厅

著录项

  • 公开/公告号JPH07198622A

    专利类型

  • 公开/公告日1995-08-01

    原文格式PDF

  • 申请/专利权人 HIKARI SYST KENKYUSHO:KK;

    申请/专利号JP19930354844

  • 发明设计人 ITO NORIHISA;

    申请日1993-12-27

  • 分类号G01N21/88;G02B6/00;G02B26/10;H01L21/66;

  • 国家 JP

  • 入库时间 2022-08-22 04:23:26

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