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VIBRATION TESTING DEVICE, VIBRATION TESTING METHOD, AND VIBRATION TESTING JIG FOR STRUCTURE

机译:结构的振动测试装置,振动测试方法和振动测试夹具

摘要

PURPOSE: To combine the vibration response calculation of a primary structure and the vibration test of the secondary structure together so as to accomplish an economical and highly precise vibration test. ;CONSTITUTION: On the basis of a vibration response calculation of a primary structure, an excitation signal for a vibrating table test of a secondary structure 4 is prepared, and a load from the secondary structure 4 is used for a vibration response calculation. For measuring the load, the secondary structure 4 is placed on a vibration testing jig, which is movable in the excitation direction. The vibration testing jig consists of a supporting member 14, which is movable in the excitation direction, a base plate 15, and the like.;COPYRIGHT: (C)1995,JPO
机译:目的:将一级结构的振动响应计算与二级结构的振动测试结合起来,以实现经济,高精度的振动测试。组成:基于初级结构的振动响应计算,准备了用于次级结构4的振动台测试的激励信号,并将来自次级结构4的载荷用于振动响应计算。为了测量负载,将次级结构4放置在振动测试夹具上,该振动测试夹具可沿激励方向移动。振动测试夹具包括可沿激励方向移动的支撑部件14,基板15等。版权所有:(C)1995,JPO

著录项

  • 公开/公告号JPH07113721A

    专利类型

  • 公开/公告日1995-05-02

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP19930258237

  • 发明设计人 HORIUCHI TOSHIHIKO;

    申请日1993-10-15

  • 分类号G01M7/02;G01M19/00;

  • 国家 JP

  • 入库时间 2022-08-22 04:22:34

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