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DESIGNING SCHEME FOR SEMICONDUCTOR INTEGRATED CIRCUIT

机译:半导体集成电路的设计方案

摘要

PURPOSE: To reduce a time required for development and a chip area by analyzing the first delay characteristic of an internal circuit, excluding an input/output buffer, subsequently, analyzing the second delay characteristic of a chip, including the input/output buffer, and then verifying whether characteristic requirements are met or not. CONSTITUTION: An internal block is laid out, and a first delay simulation is performed (101, 102). It is verified based on the result of the delay simulation whether there is no problem associated with characteristics (103). After a buffer allocating process, buffers in the internal block and a peripheral block are placed and wired, and the chip is finally laid out (104, 105). In addition a second delay simulation is performed, and final specifications are checked based on the result of the second delay simulation (106, 107). This accomplishes the reduction of the area of the chip and the time required for its development.
机译:目的:通过分析内部电路的第一延迟特性(不包括输入/​​输出缓冲器),随后分析包括输入/​​输出缓冲器的芯片的第二延迟特性,来减少开发所需的时间和芯片面积然后验证是否满足特性要求。组成:一个内部块的布局,并执行第一延迟仿真(101、102)。基于延迟仿真的结果来验证是否没有与特性相关联的问题(103)。在缓冲器分配过程之后,内部块和外围块中的缓冲器被放置并布线,并且最终布置芯片(104、105)。另外,执行第二延迟仿真,并且基于第二延迟仿真的结果检查最终规格(106、107)。这实现了芯片面积的减少以及其开发所需的时间。

著录项

  • 公开/公告号JPH08213467A

    专利类型

  • 公开/公告日1996-08-20

    原文格式PDF

  • 申请/专利权人 NEC CORP;

    申请/专利号JP19950036238

  • 发明设计人 NAGASAWA SHIGENOBU;

    申请日1995-01-31

  • 分类号H01L21/82;G06F17/50;

  • 国家 JP

  • 入库时间 2022-08-22 04:03:08

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