首页> 外国专利> A method for detecting of systematic errors are, in particular for the automatic disruption recognition in the case of quality control, by means of measuring devices equipped with measuring sensors

A method for detecting of systematic errors are, in particular for the automatic disruption recognition in the case of quality control, by means of measuring devices equipped with measuring sensors

机译:一种用于检测系统错误的方法,特别是用于质量控制的自动中断识别的方法,是通过配备有测量传感器的测量设备进行的

摘要

The invention concerns a method of detecting systematic defects, in particular for automatically detecting malfunctions in quality control processes, by means of measuring apparatus equipped with measuring sensors and with a combination of three individual sensors of the same type for parallel measurements on the same object. The measured values of the individual sensors are detected and the mean value and/or a comparative value of the measured values of the individual sensors is calculated. The deviations of the at least three individual sensors from the common mean value and/or the deviations in the comparative values of the individual sensors are determined. The mean value and/or comparative value and/or the mean value deviations and/or comparative value deviations are compared with one another during a sequence of measurements carried out at various measuring locations on a given object among an amount of identical objects or on an amount of identical objects, so that defects in the measuring apparatus can simultaneously be detected and the quality of the objects can be controlled.
机译:本发明涉及一种检测系统缺陷的方法,特别是用于通过配备有测量传感器并且具有三个相同类型的单个传感器的组合的测量设备来自动检测质量控制过程中的故障的方法,该三个单个相同类型的传感器用于在同一物体上进行并行测量。检测各个传感器的测量值并且计算各个传感器的测量值的平均值和/或比较值。确定至少三个独立传感器与共同平均值的偏差和/或独立传感器的比较值的偏差。在一定数量的相同物体中或在一定数量的物体上,在给定物体的不同测量位置进行一系列测量时,将平均值和/或比较值和/或平均值偏差和/或比较值偏差相互比较。数量的相同物体,因此可以同时检测测量设备中的缺陷,并可以控制物体的质量。

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