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Non-destructive surface inspection by shearing speckle interferometry

机译:剪切斑点干涉法进行无损表面检测

摘要

The apparatus for non-destructive surface inspection using Speckle Pattern Shearing Interferometry (Shearography) of an object (2) illuminates the object with coherent light from light source (1), which is diffusely reflected and passed through a Shearing arrangement (3) and an optical system to form a Null Shearogram and having a Loading Shearogram to produce in-plane or out-of-plane deviations by selection in the optical elements (11, 12). The object surface is illuminated from two or more directions (+Oxz, -Oxz with relation to +Oyz, -Oyz) sequentially and the pure in-plane and out-of-plane deviations are computer-generated by combining the resulting Shearograms.
机译:使用散斑图案剪切干涉法(Shearography)对物体进行无损表面检查的设备(2)用来自光源(1)的相干光照射物体,该光被漫反射并穿过剪切装置(3)和光学系统形成Null剪切图,并具有Load剪切图以通过在光学元件(11、12)中进行选择来产生平面内或平面外偏差。从两个或多个方向(相对于+ Oyz,-Oyz的+ Oxz,-Oxz)顺序照射对象表面,并且通过组合所得的剪切图,由计算机生成纯的平面内和平面外偏差。

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