首页> 外国专利> Method for testing the course of a program of instructions performed by a dedicated integrated circuit, and specific integrated circuit, connected thereto.

Method for testing the course of a program of instructions performed by a dedicated integrated circuit, and specific integrated circuit, connected thereto.

机译:用于测试由专用集成电路和与其连接的专用集成电路执行的指令程序的过程的方法。

摘要

The invention relates to a method for testing the execution of program instructions which are coded on one or more words, executed by an integrated circuit, the program being contained in a memory connected to a central unit by means of an address bus of instructions. It forms a stack of registers and it connects the battery at the address bus of instructions of such a way that the address of the first word of each instruction is executed is stored in the stack at the time of execution.
机译:本发明涉及一种用于测试由集成电路执行的以一个或多个字编码的程序指令的执行的方法,该程序包含在通过指令的地址总线连接到中央单元的存储器中。它形成一个寄存器堆栈,并在指令的地址总线上连接电池,使得在执行时将每个指令的第一个字的地址存储在堆栈中。

著录项

  • 公开/公告号FR2720174B1

    专利类型

  • 公开/公告日1996-08-14

    原文格式PDF

  • 申请/专利权人 SGS THOMSON MICROELECTRONICS SA;

    申请/专利号FR19940006492

  • 发明设计人 KLINGLER STEPHAN;

    申请日1994-05-20

  • 分类号G06F11/00;G06F9/32;

  • 国家 FR

  • 入库时间 2022-08-22 03:40:39

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