首页> 外国专利> SEMICONDUCTOR MANUFACTURING METHOD FOR DEGENERATING IMPURITY DISTRIBUTION IN CHANNEL BY PHOSPHOROUS IMPLANTATION

SEMICONDUCTOR MANUFACTURING METHOD FOR DEGENERATING IMPURITY DISTRIBUTION IN CHANNEL BY PHOSPHOROUS IMPLANTATION

机译:通过磷注入​​来退化通道中杂质分布的半导体制造方法

摘要

PROBLEM TO BE SOLVED: To degenerate the impurity distribution in a channel by implanting phosphorous. ;SOLUTION: A sacrifice oxide layer is formed on a Si substrate, an implantation for adjusting the threshold voltage is applied, the victim layer is removed, a gate oxide layer is formed, a gate poly-Si layer is deposited, defined and etched to form a gate 62, a primary P implantation is applied to form a lightly doped drain(LDD), a secondary P implantation is applied into a channel 66 to degenerate the impurity distribution curve of the channel.;COPYRIGHT: (C)1997,JPO
机译:要解决的问题:通过注入磷来退化通道中的杂质分布。 ;解决方案:在Si衬底上形成牺牲氧化物层,施加用于调节阈值电压的注入,去除牺牲层,形成栅极氧化物层,沉积,限定和蚀刻栅极多晶硅层,形成栅极62,进行一次P注入以形成轻掺杂漏极(LDD),进行二次P注入到沟道66中以退化该沟道的杂质分布曲线。COPYRIGHT:(C)1997,JPO

著录项

  • 公开/公告号JPH09162386A

    专利类型

  • 公开/公告日1997-06-20

    原文格式PDF

  • 申请/专利权人 TAIWAN MOSHII DENSHI KOFUN YUUGENKOUSHI;

    申请/专利号JP19950346552

  • 发明设计人 SOU TOSHIHIRO;

    申请日1995-12-04

  • 分类号H01L29/78;

  • 国家 JP

  • 入库时间 2022-08-22 03:35:07

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