首页> 外国专利> Apodizing filter system useful for reducing spot size in optical measurements and for other applications

Apodizing filter system useful for reducing spot size in optical measurements and for other applications

机译:切趾滤光片系统可用于减小光学测量和其他应用中的光斑尺寸

摘要

Because of diffraction effects caused by slits or apertures in optical measurement systems, the radiation energy which is directed towards a particular region on a sample will be spread over a larger area than desirable. By employing an apodizing filter in the radiation path in such system, diffraction tails of the system will be reduced. The apodizing filter preferably has a pattern of alternating high transmittance areas and substantially opaque areas where the locally averaged transmittance function is an apodizing function. In the preferred embodiment, the locally averaged transmittance function varies smoothly and monotonically from the periphery to the center of the filter.
机译:由于光学测量系统中的狭缝或孔造成的衍射效应,指向样品上特定区域的辐射能量将散布在比期望更大的面积上。通过在这样的系统的辐射路径中采用变迹滤光器,将减少系统的衍射尾。变迹滤光器优选具有交替的高透射率区域和基本上不透明的区域的图案,其中局部平均透射率函数是变迹函数。在优选实施例中,局部平均透射率函数从滤波器的外围到中心平滑且单调变化。

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