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Ambiguity resolving algorithm for interferometers of arbitray topologies

机译:任意拓扑干涉仪的歧义解析算法

摘要

An apparatus for reducing the computational requirements for resolving ambiguity in interferometer measurements where the interferometer elements are arranged arbitrarily. Each of a plurality of interferometer elements each measures the phase of the incoming electromagnetic signal. The interferometer elements are each separated by lengths defined as baselines, which are sorted and processed in ascending order. Following initialization, for each baseline (92, 108), the phase measurements of the next baseline (92, 108) to be processed are estimated. If the measured phases (94-100, 110-118) of the next baseline (92, 108) falls within a predetermined range (104, 106) of the estimated phases, the phase is retained for estimating the phases of the next baseline. After a sufficient number of baselines have been processed, the angle of the incoming electromagnetic signal may be determined in accordance with the retained phases.
机译:一种用于减少解决干涉仪测量中的歧义的计算要求的设备,其中,干涉仪元件被任意地布置。多个干涉仪元件中的每一个均测量入射电磁信号的相位。干涉仪元件各由定义为基线的长度分开,这些长度按升序排序和处理。初始化之后,对于每个基线(92、108),估计要处理的下一个基线(92、108)的相位测量。如果下一个基线(92、108)的测量相位(94-100、110-118)落在估计相位的预定范围(104、106)内,则保留该相位以估计下一个基线的相位。在处理了足够数量的基线之后,可以根据保留的相位确定输入电磁信号的角度。

著录项

  • 公开/公告号US5742252A

    专利类型

  • 公开/公告日1998-04-21

    原文格式PDF

  • 申请/专利权人 RAYTHEON COMPANY;

    申请/专利号US19960703310

  • 发明设计人 LOAN TAREE BUI;TRUNG T. NGUYEN;

    申请日1996-08-26

  • 分类号G01S5/02;

  • 国家 US

  • 入库时间 2022-08-22 02:39:44

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