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Lower bandgap, lower resistivity, silicon carbide heteroepitaxial material, and method of making same

机译:较低的带隙,较低的电阻率,碳化硅异质外延材料及其制造方法

摘要

A silicon carbide semiconductor material; and method of making same, in which a doped film of 3C-silicon carbide is grown heteroepitaxially on a 6H-silicon carbide material. Growth occurs at 1200° C. or less, and produces a heterolayer having a reduced bandgap, and hence reduced contact resistance, but which is fabricatable with the less expensive equipment commonly used to fabricate silicon based semiconductors.
机译:碳化硅半导体材料;以及其制造方法,其中在6H碳化硅材料上异质外延生长3C碳化硅的掺杂膜。生长在1200℃或更低的温度下发生,并且产生具有减小的带隙,因此减小的接触电阻的异质层,但是可以用通常用于制造硅基半导体的较便宜的设备来制造。

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