首页> 外国专利> Infrared imaging system employing on-focal plane nonuniformity correction

Infrared imaging system employing on-focal plane nonuniformity correction

机译:采用焦平面不均匀校正的红外成像系统

摘要

An infrared imaging system having a focal plane array including an array of detector elements and a readout circuit and including nonuniformity correction circuitry on the focal plane array. The individual detector elements correspond to pixels of an infrared scene to be imaged. Offsets in detection signals from each pixel arising from nonuniformities in the individual detector elements in the array are corrected by storing offset correction values for each detector element and using the stored offset values to control correction circuitry as the respective detector element signals are read out. The detector array and readout circuit are preferably formed as a monolithic or hybrid structure and the offset correction is provided on the focal plane array prior to signal amplification and analog to digital conversion.
机译:一种红外成像系统,其具有焦平面阵列,该焦平面阵列包括检测器元件阵列和读出电路,并且在焦平面阵列上包括非均匀性校正电路。各个检测器元件对应于要成像的红外场景的像素。通过存储每个检测器元件的偏移校正值,并在读出各个检测器元件信号时,使用所存储的偏移值来控制校正电路,从而校正由阵列中各个检测器元件的不均匀引起的来自每个像素的检测信号中的偏移。检测器阵列和读出电路优选形成为单片或混合结构,并且在信号放大和模数转换之前在焦平面阵列上提供偏移校正。

著录项

  • 公开/公告号US5811808A

    专利类型

  • 公开/公告日1998-09-22

    原文格式PDF

  • 申请/专利权人 AMBER ENGINEERING INC.;

    申请/专利号US19960712891

  • 发明设计人 ROBERT F. CANNATA;JEFFREY L. METSCHULEIT;

    申请日1996-09-12

  • 分类号G01J5/20;G01J5/24;

  • 国家 US

  • 入库时间 2022-08-22 02:38:35

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号