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Semiconductor integrated circuit device with large-scale memory and controller embedded on one semiconductor chip and method of testing the device
Semiconductor integrated circuit device with large-scale memory and controller embedded on one semiconductor chip and method of testing the device
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机译:具有在一个半导体芯片上嵌入的大规模存储器和控制器的半导体集成电路器件以及测试该器件的方法
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摘要
A semiconductor integrated circuit device comprises, on a semiconductor chip, a large-scale memory as a main memory, a controller for controlling at least inputting data from the outside of the chip to the large-scale memory, and outputting data from the large-scale memory to the outside of the chip, and a self-test circuit for testing the large- scale memory. The self-test circuit includes a rewritable EEPROM, into which a self-test sequence is written. The self-test circuit tests the large-scale memory in accordance with the self-test sequence written in the EEPROM.
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