首页> 外国专利> METHOD FOR DETERMINING THE DIELECTRIC CONSTANT AND THE LOSS FACTOR OF THE INDIVIDUAL INSULANT LEVELS OF MULTILAYER PRINTED-CIRCUIT BOARDS

METHOD FOR DETERMINING THE DIELECTRIC CONSTANT AND THE LOSS FACTOR OF THE INDIVIDUAL INSULANT LEVELS OF MULTILAYER PRINTED-CIRCUIT BOARDS

机译:确定多层印制电路板单个绝缘层介电常数和损耗因子的方法

摘要

Method for determining the dielectric constant and theloss factor of the individual insulant levels ofmultilayer printed-circuit boards.A method for determining the dielectric constant and/orthe loss factor of insulator layers of printed-circuitboards by using test structures fitted onto or into theprinted-circuit board at measuring frequencies in the MHzto GHz range, at least one test resonator (R) beingfitted as the test structure into or onto the printed-circuit board (1), this resonator being designed as aplanar microwave line with predetermined dimensions andpredetermined position of at least one measuring point(5), in that, for each test resonator (R), its resonantfrequency (f[err]) is determined in a frequency band in whichthis resonant frequency is to be expected, and in thatthe impedance (Z[err]) at the measuring point is then deter-mined at this resonant frequency, and lastly thedielectric constant and/or the loss factor are determinedby computer from the predetermined dimensions of eachtest resonator (R) and from the determined values of theresonant frequency and of the real part of the impedanceby using the line equations.
机译:介电常数的测定方法个别绝缘水平的损耗因数多层印刷电路板。确定介电常数和/或的方法印刷电路绝缘层的损耗因子通过使用安装在其上或内部的测试结构印刷电路板,测量频率为MHz至GHz范围,至少一个测试谐振器(R)作为测试结构安装在印刷品的内部或表面,电路板(1),该谐振器设计为具有预定尺寸的平面微波线和至少一个测量点的预定位置(5),因为对于每个测试谐振器(R),其谐振频率(f [err])在其中这个谐振频率是可以预期的,在那个然后,在测量点处的阻抗(Z [err])可以确定-在这个共振频率下开采,最后确定介电常数和/或损耗因子通过计算机从每个预定尺寸测试谐振器(R)并根据确定的谐振频率和阻抗的实部通过使用线方程。

著录项

  • 公开/公告号SG64434A1

    专利类型

  • 公开/公告日1999-04-27

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号SG19970002964

  • 发明设计人 NAGEL JOERG;

    申请日1997-08-16

  • 分类号G01R27/26;

  • 国家 SG

  • 入库时间 2022-08-22 02:25:49

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