首页> 外国专利> METHOD OF FABRICATING SCHOTTKY BARRIER DIODES AND SCHOTTKY BARRIER DIODE CLAMPED TRANSISTORS

METHOD OF FABRICATING SCHOTTKY BARRIER DIODES AND SCHOTTKY BARRIER DIODE CLAMPED TRANSISTORS

机译:制造肖特基势垒二极管和肖特基势垒二极管钳位晶体管的方法

摘要

The Schottky diode is formed with an intrinsic polysilicon layer that separates the metal silicide layer from the active region in the form of n conductivity. This structure eliminates the need for a process step of opening a window in the intrinsic polysilicon layer as compared to prior devices and reduces the surface area needed to form a Schottky diode. The Schottky diode can be formed as part of the overall process for forming an integrated circuit and can be placed in parallel across the collector / base junction of the bipolar transistor to form a Schottky barrier diode clamped transistor.
机译:肖特基二极管形成有本征多晶硅层,该本征多晶硅层将金属硅化物层与有源区隔离为n导电性。与现有器件相比,这种结构消除了在本征多晶硅层中打开窗口的工艺步骤的需要,并减小了形成肖特基二极管所需的表面积。肖特基二极管可以作为形成集成电路的整个过程的一部分而形成,并且可以跨双极晶体管的集电极/基极结并联放置,以形成肖特基势垒二极管钳位晶体管。

著录项

  • 公开/公告号KR100200059B1

    专利类型

  • 公开/公告日1999-07-01

    原文格式PDF

  • 申请/专利权人 NATIONAL SEMICONDUCTOR CORPORATION;

    申请/专利号KR19910014120

  • 发明设计人 밴처드 드롱;

    申请日1991-08-16

  • 分类号H01L29/40;

  • 国家 KR

  • 入库时间 2022-08-22 02:15:50

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