首页>
外国专利>
Osmium rectification Schottky and ohmic junctions and tungsten / tungsten carbide / titanium carbide on silicon carbide ohmic contacts
Osmium rectification Schottky and ohmic junctions and tungsten / tungsten carbide / titanium carbide on silicon carbide ohmic contacts
展开▼
机译:carbide整流肖特基和欧姆结以及碳化硅欧姆触点上的钨/碳化钨/碳化钛
展开▼
页面导航
摘要
著录项
相似文献
摘要
Metal osmium on SiC (beta or ) forms an effective barrier to the diffusion of contact and conductive metals that are firmly attached to the SiC substrate. On p-type SiC (12), Os is 10-4ohm-cm2Contact resistivity of the ohmic contact. Ohmic and rectifying contacts to the TiC film 30 on the SiC substrate 12 are formed by sequentially depositing the WC film 32 and the metal W film 34 on the TiC film 30. [ These contacts are stable to at least 1150C. The electrode 38 is connected directly to the upper contact via a protective bonding film 36 such as Pt or PtAu.
展开▼