首页> 外国专利> Projecting printing apparatus, projection printing method, mask pattern for estimating amplitude aberrations, method of estimating the quantity of amplitude aberration, and amplitude-aberration estimating filter

Projecting printing apparatus, projection printing method, mask pattern for estimating amplitude aberrations, method of estimating the quantity of amplitude aberration, and amplitude-aberration estimating filter

机译:投影打印装置,投影打印方法,用于估计振幅像差的掩模图案,用于估计振幅像差的量的方法以及用于校正振幅像差的滤波器

摘要

In a projection printing apparatus, illumination light from a lamp housing illuminates a photomask, and a diffracted light beam from the photomask is focused on an exposed substrate via a projection optical system to project a circuit pattern, the projection optical system including first and second halfmirrors and first and second concave mirrors. The first and second halfmirrors are arranged in symmetry or similar symmetry with respect to a normal to an optical axis of a diffracted light beam directed from the first halfmirror to the second halfmirror. Thus, a projection printing apparatus and a projection printing method are obtained in which unevenness in transmissivity in the projection optical system can be compensated for and steric hindrance or degradation of image characteristics is not caused.
机译:在投影印刷设备中,来自灯罩的照明光照射光掩模,并且来自光掩模的衍射光束经由投影光学系统聚焦在曝光的基板上以投影电路图案,该投影光学系统包括第一和第二半反射镜。第一和第二凹面镜。第一半反射镜和第二半反射镜相对于从第一半反射镜指向第二半反射镜的衍射光束的光轴的法线对称或相似地排列。因此,获得了可以补偿投影光学系统中的透射率不均匀并且不会引起位阻或图像特性劣化的投影打印设备和投影打印方法。

著录项

  • 公开/公告号US6061188A

    专利类型

  • 公开/公告日2000-05-09

    原文格式PDF

  • 申请/专利权人 MITSUBISHI DENKI KABUSHIKI KAISHA;

    申请/专利号US19970982221

  • 发明设计人 KAZUYA KAMON;

    申请日1997-12-01

  • 分类号G02B17/00;G02B27/14;

  • 国家 US

  • 入库时间 2022-08-22 01:37:13

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