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COMPOSITION FOR FORMING PLZT FERROELECTRIC THIN FILM AND FORMATION OF THE THIN FILM

机译:PLZT铁电薄膜的形成组成和薄膜的形成

摘要

PROBLEM TO BE SOLVED: To obtain a striation-free, high-quality PLZT ferroelectric thin film. ;SOLUTION: The subject perovskite-type PLZT ferroelectric thin film-forming composition comprising respective alkoxides, partial hydrolyzates and/or organic acid salts of Pb, La, Zr and Ti is such as to be ≤0.8 wt.% in moisture content. A method for forming a PLZT ferroelectric thin film comprises the following procedure: a heat-resistant substrate is coated with the above composition followed by heating in air, an oxidative atmosphere or hydrous vapor atmosphere, this practice is repeated until a film of desired thickness is afforded, and during or after heating at least in the final step, the film is baked at the crystallization temperature or higher.;COPYRIGHT: (C)2001,JPO
机译:要解决的问题:获得无条纹的高质量PLZT铁电薄膜。解决方案:包含钙,Pb,La,Zr和Ti的各醇盐,部分水解产物和/或有机酸盐的主题钙钛矿型PLZT铁电薄膜形成组合物的含水量约为0.8重量%。形成PLZT铁电薄膜的方法包括以下步骤:用上述组合物涂覆耐热基材,然后在空气,氧化气氛或水蒸气气氛中加热,重复该操作直至所需厚度的膜为提供,并且至少在最后一步加热期间或之后,要在结晶温度或更高的温度下烘烤薄膜。版权所有:(C)2001,JPO

著录项

  • 公开/公告号JP2001048540A

    专利类型

  • 公开/公告日2001-02-20

    原文格式PDF

  • 申请/专利权人 MITSUBISHI MATERIALS CORP;

    申请/专利号JP19990224208

  • 发明设计人 MAKI KAZUMASA;SOYAMA NOBUYUKI;

    申请日1999-08-06

  • 分类号C01G25/00;

  • 国家 JP

  • 入库时间 2022-08-22 01:28:14

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