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METHOD OF SPECTROCHEMICAL ANALYSIS OF IMPURITY IN GAS

机译:气体杂质的光化学分析方法

摘要

The present invention provides an absorption spectrographic analysis method which uses frequency modulated semiconductor laser light. In this method an absorption spectrum is measured by setting a current value B at which saturation of variation in laser emitting power which accompanies increases in injection current for a semiconductor laser as a lower limit current value for the injection current to the semiconductor laser-emitting element; setting a current value C at which variation in wavelength transition which accompanies increases in injection current initially becomes minimal as an upper limit current value for the injection current to the semiconductor laser-emitting element; and using laser light which oscillates at an injection current region between this lower limit current value and this upper limit current value as the semiconductor laser light. According to the method of the present invention, it is possible to measure minute amounts of impurities contained in gases with high sensitivity and accuracy. IMAGE
机译:本发明提供了使用调频半导体激光的吸收光谱分析方法。在该方法中,通过设定电流值B来测量吸收光谱,在该电流值B处,伴随着半导体激光器的注入电流的增加的激光发射功率的变化的饱和度作为对半导体激光器发射元件的注入电流的下限电流值。 ;设定电流值C作为注入半导体激光发射元件的注入电流的上限电流值,在该电流值C处,随着注入电流的增加而引起的波长转变的变化起初将变得最小。并且,使用在该下限电流值和该上限电流值之间的注入电流区域振荡的激光作为半导体激光。根据本发明的方法,可以以高灵敏度和准确度测量气体中所含微量杂质。 <图像>

著录项

  • 公开/公告号EP0977028A4

    专利类型

  • 公开/公告日2001-05-23

    原文格式PDF

  • 申请/专利权人 NIPPON SANSO CORPORATION;

    申请/专利号EP19990901876

  • 发明设计人 WU SHANG-QIAN;MORISHITA JUN-ICHI;

    申请日1999-01-27

  • 分类号G01N21/39;

  • 国家 EP

  • 入库时间 2022-08-22 01:16:30

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