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High-Speed and Fine Accuracy Inspection System by the Integration of the Phase Analysis of Laser and Visual Image Signal Processing

机译:激光与视觉图像信号处理相结合的高速精细检测系统

摘要

PURPOSE: A high-speed precision examination system using a combination of a laser phase shift analysis and a visible ray video signal analysis is provided to measure a pattern and a surface roughness of a thin film by scanning a laser beam to a panel and detecting the laser beam reflected on the panel. CONSTITUTION: A laser generator(1) generates a laser beam with a predetermined wavelength. A laser modulator(2) modulates or demodulates the laser beam outputted from the laser generator(1). A reference beam detector(92) detects a part of the modulated laser beam outputted from the laser modulator(2) as a reference beam. An optic system scans the modulated laser beam to a measuring object(71) loaded on a table. A reflective beam detector(91) detects the laser beam reflected by the measuring object(71). A data processing device(10) compares a detected signal of the reference beam detector(92) with a detected signal of the reflective beam detector(91) and determines a difference of pattern composition and a surface roughness of the measuring object by analyzing a frequency.
机译:目的:提供一种结合了激光相移分析和可见光视频信号分析的高速精密检查系统,以通过扫描激光束到面板并检测其表面来测量薄膜的图案和表面粗糙度。激光束反射在面板上。组成:激光发生器(1)产生预定波长的激光束。激光调制器(2)调制或解调从激光发生器(1)输出的激光束。参考光束检测器(92)将从激光调制器(2)输出的调制激光束的一部分检测为参考光束。光学系统将调制的激光束扫描到装载在工作台上的测量对象(71)。反射光束检测器(91)检测被测量物体(71)反射的激光束。数据处理设备(10)将参考光束检测器(92)的检测信号与反射光束检测器(91)的检测信号进行比较,并通过分析频率来确定图案成分和测量对象的表面粗糙度的差异。 。

著录项

  • 公开/公告号KR20010074256A

    专利类型

  • 公开/公告日2001-08-04

    原文格式PDF

  • 申请/专利权人 KANG HYON IN;

    申请/专利号KR20010023996

  • 发明设计人 CHOI TAE WAN;KANG HYON IN;

    申请日2001-05-03

  • 分类号G01B11/30;

  • 国家 KR

  • 入库时间 2022-08-22 01:13:07

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