首页> 外国专利> Non destructive ultra-sound test method for detecting internal faults in cathodic pulverized targets to be deposited on substrate of integrated circuit, determines real fault inclusion

Non destructive ultra-sound test method for detecting internal faults in cathodic pulverized targets to be deposited on substrate of integrated circuit, determines real fault inclusion

机译:用于检测要沉积在集成电路基板上的阴极粉碎目标内部故障的无损超声测试方法,确定实际故障包括

摘要

The method has the following stages: (a) the dimension of the real internal fault is determined in a pulverization target material by sweeping it with ultrasound and recording the amplitude of the generated signal; (b) a metallurgical measurement is made of the internal fault dimension by exposing it; (c) the measurement is correlated with the metallurgical measurement to obtain a correlation factor for the material of the target, the factor when multiplied by future ultrasound measurement for a fault gives the real dimension of the fault.
机译:该方法有以下几个阶段:(a)通过用超声波对其进行扫掠并记录所产生信号的幅度来确定粉碎目标材料中实际内部故障的尺寸; (b)通过暴露对内部断层尺寸进行冶金测量; (c)将测量值与冶金测量值相关联以获得目标材料的相关因子,该因子与故障的未来超声测量值相乘即可得出故障的真实尺寸。

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