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Fluorescent x-ray analyzing apparatus and secondary target device disposed therein

机译:荧光X射线分析装置及设置在其中的二次靶装置

摘要

A fluorescent X-ray analyzing apparatus includes a secondary target device therein. The secondary target device includes a target main body, and an X-ray blocking member for preventing an irradiation of primary X-rays from a X-ray source to a sample. The target main body is formed of plural target members in which secondary target materials are formed on at least target surfaces facing a central axis, and the target members are arranged concentrically to have different distances from the central axis. Accordingly, the primary X-rays do not pass through a space between the target members, and are irradiated only at the target surfaces of the target members. The secondary X-rays from the target surfaces pass through the space between the target members, and reach the sample.
机译:荧光X射线分析设备在其中包括次级靶装置。次级靶装置包括靶主体和用于防止初级X射线从X射线源照射到样品的X射线阻挡构件。靶主体由多个靶构件形成,其中至少在面向中心轴的靶表面上形成次级靶材料,并且将靶构件同心地布置成与中心轴具有不同的距离。因此,一次X射线不通过靶材之间的空间,而仅照射在靶材的靶面上。来自目标表面的二次X射线穿过目标构件之间的空间,并到达样品。

著录项

  • 公开/公告号US2001033635A1

    专利类型

  • 公开/公告日2001-10-25

    原文格式PDF

  • 申请/专利权人 SHIMADZU CORPORATION;

    申请/专利号US20010826846

  • 发明设计人 SHOJI KUWABARA;

    申请日2001-04-06

  • 分类号G01N23/223;

  • 国家 US

  • 入库时间 2022-08-22 01:06:55

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