首页> 外国专利> Self-aligned silicide process for silicon sidewall source and drain contacts and structure formed thereby

Self-aligned silicide process for silicon sidewall source and drain contacts and structure formed thereby

机译:用于硅侧壁源极和漏极触点的自对准硅化物工艺及其形成的结构

摘要

A method (and structure formed thereby) of forming a metal silicide contact on a non-planar silicon containing region having controlled consumption of the silicon containing region, includes forming a blanket metal layer over the silicon containing region, forming a silicon layer over the metal layer, etching anisotropically and selectively with respect to the metal the silicon layer, reacting the metal with silicon at a first temperature to form a metal silicon alloy, etching unreacted portions of the metal layer, annealing at a second temperature to form an alloy of metal-Si2, and selectively etching the unreacted silicon layer.
机译:一种在具有受控的含硅区域消耗的非平面含硅区域上形成金属硅化物接触的方法(由此形成的结构),包括在含硅区域上方形成覆盖金属层,在金属上方形成硅层层,相对于金属各向异性地且选择性地蚀刻硅层,使金属与硅在第一温度下反应以形成金属硅合金,蚀刻金属层的未反应部分,在第二温度下退火以形成金属合金-Si 2 ,并选择性地蚀刻未反应的硅层。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号