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Non-volatile semiconductor memory device having a function for controlling the range of distribution of memory cell threshold voltages
Non-volatile semiconductor memory device having a function for controlling the range of distribution of memory cell threshold voltages
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机译:具有用于控制存储单元阈值电压的分布范围的功能的非易失性半导体存储装置
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摘要
A non-volatile semiconductor memory device according to the invention comprises a memory cell array having a plurality of non-volatile memory cells, and a write state machine controlling a voltage applied to a memory cell selected from the memory cell array and a voltage application period, in accordance with each of reading of data from the selected memory cell, writing of data into the selected memory cell, and erasion of data from the selected memory. The write state machine executes writing, under a first writing condition, on a predetermined number of memory cells included in the memory cell array, and executes writing on memory cells other than the predetermined number of memory cells, under a second writing condition set in accordance with a result of the writing executed under the first writing condition.
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