首页> 外国专利> Production of a trench in a semiconductor substrate comprises arranging a mask on the substrate having a window, electrochemically etching the surface exposed by the window, forming a porous substrate and removing the porous substrate

Production of a trench in a semiconductor substrate comprises arranging a mask on the substrate having a window, electrochemically etching the surface exposed by the window, forming a porous substrate and removing the porous substrate

机译:在半导体衬底中制造沟槽的步骤包括:在具有窗口的衬底上布置掩模;电化学蚀刻由窗口暴露的表面;形成多孔衬底;以及去除多孔衬底。

摘要

Production of a trench (5) in a semiconductor substrate (1) comprises: (i) arranging a mask (2) on the substrate having a window (3) in which a substrate surface (4) is exposed; (ii) electrochemically etching the substrate from the substrate surface exposed by the window; (iii) forming a porous substrate (6) in a trench-like region from the substrate surface; and (iv) removing the porous substrate from the trench-like region. Preferred Features: The porous substrate has a thickness of 20-80% of the substrate. The porous substrate is etched using an alkaline etching agent, preferably KOH. The porous substrate is oxidized to form a porous substrate oxide. The substrate contains silicon.
机译:在半导体衬底(1)中制造沟槽(5)包括:(i)在具有窗口(3)的衬底上布置掩模(2),在该窗口中暴露衬底表面(4)。 (ii)从窗口暴露的衬底表面上电化学腐蚀衬底; (iii)在距基板表面的沟槽状区域中形成多孔基板(6); (iv)从沟槽状区域去除多孔质基板。优选特征:多孔基材的厚度为基材的20-80%。使用碱性蚀刻剂,优选KOH,蚀刻多孔基板。氧化多孔基材以形成多孔基材氧化物。基板包含硅。

著录项

  • 公开/公告号DE10036724A1

    专利类型

  • 公开/公告日2002-02-14

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE2000136724

  • 发明设计人 KIRCHHOFF MARKUS;

    申请日2000-07-27

  • 分类号H01L21/306;H01L21/8242;

  • 国家 DE

  • 入库时间 2022-08-22 00:27:34

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