首页> 外国专利> Semiconductor device e.g. metal oxide semiconductor transistor, has gate electrode with polysilicon layer having reverse tapering portion to enlarge distance between gate electrode and contact plug

Semiconductor device e.g. metal oxide semiconductor transistor, has gate electrode with polysilicon layer having reverse tapering portion to enlarge distance between gate electrode and contact plug

机译:半导体器件金属氧化物半导体晶体管,具有带有多晶硅层的栅电极,该多晶硅层具有反向锥形部分以扩大栅电极和接触塞之间的距离

摘要

A polysilicon layer (6a) of a gate electrode (6), has a reverse tapering portion, so as to enlarge the distance between a contact plug (10) and the gate electrode. An Independent claim is included for semiconductor device manufacture method.
机译:栅电极(6)的多晶硅层(6a)具有倒锥形部分,从而增大了接触塞(10)和栅电极之间的距离。半导体器件制造方法包括独立权利要求。

著录项

  • 公开/公告号DE10158706A1

    专利类型

  • 公开/公告日2002-07-04

    原文格式PDF

  • 申请/专利权人 NEC CORP. TOKIO/TOKYO;

    申请/专利号DE2001158706

  • 发明设计人 NISSA MITSUO;

    申请日2001-11-29

  • 分类号H01L29/78;H01L21/336;H01L27/108;

  • 国家 DE

  • 入库时间 2022-08-22 00:26:52

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