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A METHOD FOR SAMPLE CHARACTERIZATION BY DETERMINING A FUNCTION OF AT LEAST ONE SPECIFIC PROPERTY OF THE SAMPLE

机译:通过确定样本的至少一个特定属性的函数进行样本表征的方法

摘要

A method for characterizing samples having units, by monitoring fluctuating intensities of radiation emitted, scattered and/or reflected by said units in at least one measurement volume, the monitoring being performed by at least one detection means, said method comprising the steps of: a) measuring in a repetitive mode a length of time intervals between photon counts, b) determining a function of the length of said time intervals, c) determining a function of at least one specific physical property of said units on basis of said function of the length of time intervals.
机译:一种通过在至少一个测量体积中监视由所述单元发射,散射和/或反射的辐射的波动强度来表征具有单元的样品的方法,所述监视由至少一个检测装置执行,所述方法包括以下步骤: )以重复模式测量光子计数之间的时间间隔长度,b)确定所述时间间隔长度的函数,c)基于光子计数的所述函数确定所述单元的至少一种特定物理特性的函数时间间隔的长度。

著录项

  • 公开/公告号DE69803209T2

    专利类型

  • 公开/公告日2002-08-14

    原文格式PDF

  • 申请/专利权人 EVOTEC OAI AG;

    申请/专利号DE1998603209T

  • 发明设计人 PALO KAUPO;

    申请日1998-09-29

  • 分类号G01J3/457;G01N15/02;

  • 国家 DE

  • 入库时间 2022-08-22 00:24:47

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