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A METHOD FOR SAMPLE CHARACTERIZATION BY DETERMINING A FUNCTION OF AT LEAST ONE SPECIFIC PROPERTY OF THE SAMPLE
A METHOD FOR SAMPLE CHARACTERIZATION BY DETERMINING A FUNCTION OF AT LEAST ONE SPECIFIC PROPERTY OF THE SAMPLE
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机译:通过确定样本的至少一个特定属性的函数进行样本表征的方法
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摘要
A method for characterizing samples having units, by monitoring fluctuating intensities of radiation emitted, scattered and/or reflected by said units in at least one measurement volume, the monitoring being performed by at least one detection means, said method comprising the steps of: a) measuring in a repetitive mode a length of time intervals between photon counts, b) determining a function of the length of said time intervals, c) determining a function of at least one specific physical property of said units on basis of said function of the length of time intervals.
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