首页> 外国专利> CALIBRATION METHOD FOR SENSITIVITY OF X-RAY FOREIGN MATTER INSPECTION APPARATUS AND FOREIGN MATTER SAMPLE BODY FOR SENSITIVITY CALIBRATION

CALIBRATION METHOD FOR SENSITIVITY OF X-RAY FOREIGN MATTER INSPECTION APPARATUS AND FOREIGN MATTER SAMPLE BODY FOR SENSITIVITY CALIBRATION

机译:X射线外物检查装置灵敏度的标定方法及用于灵敏度标定的外物样品体

摘要

PPROBLEM TO BE SOLVED: To provide a calibration method which enables a sensitivity calibration operation of an X-ray foreign matter inspection apparatus efficiently and to provide a foreign matter sample body for sensitivity calibration. PSOLUTION: The calibration method for the sensitivity of the X-ray foreign matter inspection apparatus which detects foreign matter contained in a specimen by transmitted X-rays enables the use of the foreign matter sample body which is provided integrally with a foreign matter sample having a first volume and a foreign matter sample having a second volume as one set to irradiate the specimen to which the foreign matter sample body is added with X-rays. The sensitivity of the X-ray foreign matter inspection apparatus is calibrated by a foreign matter detection signal, with reference to the foreign matter samples having the different volumes, which is output based on image data on its transmitted X-ray image. PCOPYRIGHT: (C)2003,JPO
机译:

要解决的问题:提供一种能够有效地对X射线异物检查装置进行灵敏度校准操作的校准方法,并提供用于灵敏度校准的异物样品体。

解决方案:用于通过透射X射线检测样本中所含异物的X射线异物检查设备的灵敏度的校准方法使得能够使用与异物一体提供的异物样品体将具有第一体积的样品和具有第二体积的异物样品作为一组,以用X射线照射添加了异物样品体的样品。 X射线异物检查装置的灵敏度通过异物检测信号来校准,该异物检测信号参照具有不同体积的异物样本,该异物样本基于关于其透射的X射线图像的图像数据而输出。

版权:(C)2003,日本特许厅

著录项

  • 公开/公告号JP2003232752A

    专利类型

  • 公开/公告日2003-08-22

    原文格式PDF

  • 申请/专利权人 YAMATO SCALE CO LTD;

    申请/专利号JP20020033359

  • 发明设计人 KAWANISHI KATSUZO;

    申请日2002-02-12

  • 分类号G01N23/04;G01T7/00;

  • 国家 JP

  • 入库时间 2022-08-22 00:19:40

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号