首页> 外国专利> LANDING CONDITION MEASURING METHOD, LANDING CONTROL METHOD AND LANDING CONDITION MEASURING DEVICE OF CATHODE-RAY TUBE DEVICE

LANDING CONDITION MEASURING METHOD, LANDING CONTROL METHOD AND LANDING CONDITION MEASURING DEVICE OF CATHODE-RAY TUBE DEVICE

机译:阴极射线管装置的起落条件测定方法,起落控制方法及起落条件测定装置

摘要

PROBLEM TO BE SOLVED: To provide a landing measuring method, a landing control method and a landing condition measuring device of a cathode-ray tube device which can measure the landing condition without the need for considering the influence of a local doming.;SOLUTION: At each measuring point 101-109 on a display screen 9 of the cathode-ray tube device 7, measurement patterns displayed in measuring regions 201a-201d are sequentially switched over at prescribed intervals and are displayed to measure mislanding quantities. Thus, since partial light emission over a long time is eliminated due to mislandigns can be controlled without the need for considering the influence of local doming.;COPYRIGHT: (C)2003,JPO
机译:要解决的问题:提供一种阴极射线管装置的着陆测量方法,着陆控制方法和着陆状态测量装置,其能够在无需考虑局部隆起的影响的情况下测量着陆状态。在阴极射线管装置7的显示屏9上的每个测量点101-109处,以规定的间隔依次切换显示在测量区域201a-201d中的测量图案,并显示以测量着陆量。因此,由于可以消除由于误判而导致的长时间的部分发光,而无需考虑局部拱顶的影响即可得到控制。; COPYRIGHT:(C)2003,JPO

著录项

  • 公开/公告号JP2003187703A

    专利类型

  • 公开/公告日2003-07-04

    原文格式PDF

  • 申请/专利权人 MATSUSHITA ELECTRIC IND CO LTD;

    申请/专利号JP20010385826

  • 发明设计人 AMANO ATSUSHI;

    申请日2001-12-19

  • 分类号H01J9/42;H01J9/44;H04N17/04;

  • 国家 JP

  • 入库时间 2022-08-22 00:14:33

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