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Method for increasing the measurement information available from a transmission electron microscope and a transmission electron microscopy device
Method for increasing the measurement information available from a transmission electron microscope and a transmission electron microscopy device
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机译:增加可从透射电子显微镜和透射电子显微镜设备获得的测量信息的方法
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摘要
This invention relates to a method for increasing the measurement information available from a transmission electron microscope, said information relating to a measurement sample, comprising the step of: including, in said transmission electron microscope, an atomic force microscopy device. This invention also relates to a transmission electron microscopy device, characterised in that a transmission electron microscope is combined with an atomic force microscope, positioned within said transmission electron microscope. Finally, the invention relates to a device for insertion in a transmission electron microscope, characterised in that said device comprises an atomic force microscopy device.
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