首页> 外国专利> X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects

X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects

机译:从确定为可疑物体的可变放置散射体的相干散射进行X射线检查

摘要

A system and method for inspecting an enclosure with penetrating radiation. Radiation side-scattered from an object within the enclosure is detected, allowing the object to be located. If the object is deemed suspect, a volume element of the suspect object is further irradiated with penetrating radiation, and radiation coherently-scattered by the volume element is detected. The energy spectrum and angular distribution of the coherently-scattered radiation are used to characterize the volume element of the suspect object.
机译:一种用于检查具有穿透辐射的外壳的系统和方法。检测到从外壳内的物体侧向散射的辐射,从而可以定位物体。如果认为该物体是可疑的,则用穿透辐射进一步照射该可疑物体的体积元素,并且检测由该体积元素相干散射的辐射。相干散射辐射的能谱和角度分布用于表征可疑对象的体积元素。

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