Test Item Support Which Can Simulate Real Thermal Contact Conductance at Thermal Vacuum Chamber

摘要

PURPOSE: A sample support of a thermal vacuum chamber is provided to reduce a testing time by quickly adjusting the temperature of a base plate of a satellite component. CONSTITUTION: An upper plate(1) of a sample support is located inside a thermal vacuum chamber. A satellite structure putting a satellite component and a thermal filler are combined through a fixing bolt by forming many fixing holes(2) in the upper plate. A sample support(20) is formed in the lower part of the upper plate. The sample support comprises a thermal exchanging pipe(9) having an inlet(3) and an outlet. Thereby, the reliable environment test is possible by realizing the same value as an actual contact heat transfer.