首页> 外国专利> Measurement system for measuring optical properties of object, especially flat screen, has inclination device enabling free light source inclination adjustment in same inclination plane as detector

Measurement system for measuring optical properties of object, especially flat screen, has inclination device enabling free light source inclination adjustment in same inclination plane as detector

机译:用于测量物体,尤其是平板的光学特性的测量系统具有倾斜装置,该倾斜装置能够在与检测器相同的倾斜平面内自由调整光源的倾斜度

摘要

The system has a measurement head (12) rotatable about an axis normally perpendicular to a measurement plane, a detector (18) on the head, a first inclination device (20) or setting the detector's inclination angle, a light source (22) on the head and a first bearing for the object. A second inclination device (30) enables free adjustment of the light source inclination in the same inclination plane as the detector. AN Independent claim is also included for the following: (a) a measurement head, especially for an inventive system for measuring the optical properties of an object.
机译:该系统具有可绕通常垂直于测量平面的轴线旋转的测量头(12),该头上的检测器(18),第一倾斜装置(20)或设置检测器的倾斜角度,光源(22)头部和对象的第一个方位。第二倾斜装置(30)能够在与检测器相同的倾斜平面内自由调节光源的倾斜。还包括以下内容的独立权利要求:(a)测量头,尤其是用于测量物体的光学特性的发明系统。

著录项

  • 公开/公告号DE10134458A1

    专利类型

  • 公开/公告日2003-02-06

    原文格式PDF

  • 申请/专利权人 AUTRONIC-MELCHERS GMBH;

    申请/专利号DE2001134458

  • 发明设计人 KREIS JUERGEN;NEUMEIER JUERGEN;

    申请日2001-07-16

  • 分类号G01M11/02;G01J3/00;G02F1/13;G01J1/00;G02B21/24;G09F9/35;

  • 国家 DE

  • 入库时间 2022-08-21 23:42:53

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号