首页> 外国专利> Measuring device, used for measuring current densities during galvanizing of circuit boards, comprises an electrically conducting measuring surface and an electrically conducting contact on the rear side, and an electrical connection

Measuring device, used for measuring current densities during galvanizing of circuit boards, comprises an electrically conducting measuring surface and an electrically conducting contact on the rear side, and an electrical connection

机译:用于在电路板镀锌过程中测量电流密度的测量装置,包括一个导电的测量面和一个位于背面的导电触点以及一个电连接

摘要

Measuring device comprises an electrically conducting measuring surface (6) and an electrically conducting contact on the rear side; and an electrical connection consisting of electrical conductors and a shunt (10) connected in series. The electrical connection joins the measuring surface and the contact on a short path. Two electrical conductors collect the measuring signal from the shunt and feed it to an amplifier and/or evaluation unit. The measuring surface is electrically insulated from the contact by an isolator (11). Preferably the contact is in the form of a contact surface (12). The measuring surface, isolator and contact surface are arranged in a planar parallel manner.
机译:测量装置包括导电的测量表面(6)和在后侧的导电触点;电连接包括电导体和串联连接的分流器(10)。电气连接在短路径上连接测量表面和触点。两个电导体从分流器收集测量信号,并将其馈送到放大器和/或评估单元。测量表面通过隔离器(11)与触点电绝缘。优选地,接触是接触表面(12)的形式。测量表面,隔离器和接触表面以平面平行的方式布置。

著录项

  • 公开/公告号DE20301606U1

    专利类型

  • 公开/公告日2003-04-03

    原文格式PDF

  • 申请/专利权人 HUEBEL EGON;

    申请/专利号DE2003201606U

  • 发明设计人

    申请日2003-01-25

  • 分类号C25D21/12;G01R19/08;G01R15/04;G08C17/02;

  • 国家 DE

  • 入库时间 2022-08-21 23:41:01

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号